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Transmission Electron Microscopy and Diffractometry of Materials

Fultz, Brent.

Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe. - Third Edition. - Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008. - v.: digital

ISBN: 9783540738862

Subjects--Topical Terms:
Chemistry
Particles (Nuclear physics)
Crystallography
Surfaces (Physics)
Chemistry
Characterization and Evaluation of Materials
Surfaces and Interfaces, Thin Films
Crystallography
Solid State Physics and Spectroscopy
Physics and Applied Physics in Engineering

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