Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices

Sikula, Josef.

Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices [electronic resource] / edited by Josef Sikula, Michael Levinshtein. - Dordrecht : Springer Science + Business Media, Inc., 2005. - v.: digital - NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry, 151 1568-2609 ; .

9781402021701


Physics
Weights and measures
Optical materials
Physics
Optical and Electronic Materials
Electronic and Computer Engineering
Measurement Science, Instrumentation

TK7867.5 / S55 2005

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