Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder.

By: Yeung, Dit-YanContributor(s): Kwok, James T | Fred, Ana | Roli, Fabio | Ridder, Dick | SpringerLink (Online service)Material type: Computer fileComputer fileSeries: Lecture Notes in Computer Science, 4109Publisher: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006Description: v.: digitalISBN: 9783540372417Subject(s): Computer science | Computational complexity | Artificial intelligence | Computer graphics | Computer vision | Optical pattern recognition | Computer Science | Pattern Recognition | Discrete Mathematics in Computer Science | Artificial Intelligence (incl. Robotics) | Computer Graphics | Image Processing and Computer VisionLOC classification: TK7882.P3 | Y48 2006Online resources: Click here to access online In: Springer eBooks
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Item type Current location Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital
Responsable: Alejandra Vargas Mejía
Colección Digital
TK7882.P3 Y48 2006 (Browse shelf) Link to resource 1 Available Springerlink BDIG00012697

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