Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder.
Material type:
Computer fileSeries: Lecture Notes in Computer Science, 4109Publisher: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006Description: v.: digitalISBN: 9783540372417Subject(s): Computer science | Computational complexity | Artificial intelligence | Computer graphics | Computer vision | Optical pattern recognition | Computer Science | Pattern Recognition | Discrete Mathematics in Computer Science | Artificial Intelligence (incl. Robotics) | Computer Graphics | Image Processing and Computer VisionLOC classification: TK7882.P3 | Y48 2006Online resources: Click here to access online
In:
Springer eBooks
| Item type | Current location | Call number | URL | Copy number | Status | Notes | Date due | Barcode |
|---|---|---|---|---|---|---|---|---|
Libro Electrónico
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Biblioteca Digital
Responsable: Alejandra Vargas Mejía
Colección Digital
|
TK7882.P3 Y48 2006 (Browse shelf) | Link to resource | 1 | Available | Springerlink | BDIG00012697 |
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