Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder.
Material type:
Computer fileSeries: Lecture Notes in Computer Science ; 4109Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006.Description: v.: digitalISBN: - 9783540372417
- Computer science
- Computational complexity
- Artificial intelligence
- Computer graphics
- Computer vision
- Optical pattern recognition
- Computer Science
- Pattern Recognition
- Discrete Mathematics in Computer Science
- Artificial Intelligence (incl. Robotics)
- Computer Graphics
- Image Processing and Computer Vision
- TK7882.P3 Y48 2006
| Item type | Current library | Call number | URL | Copy number | Status | Notes | Date due | Barcode | |
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Libro Electrónico
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Biblioteca Digital Colección Digital | TK7882.P3 Y48 2006 (Browse shelf(Opens below)) | Link to resource | 1 | Available | Springerlink | BDIG00012697 |
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