Micro and Nano Mechanical Testing of Materials and Devices [electronic resource] / edited by James C.M. Li, Fuqian Yang.

By: Contributor(s): Material type: Computer fileComputer filePublication details: Boston, MA : Springer-Verlag US, 2008.Description: v.: digitalISBN:
  • 9780387787015
Subject(s): LOC classification:
  • TK7875  L55 2008
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number Vol info URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7875 L55 2008 (Browse shelf(Opens below)) BDIG00002897 Link to resource 1 Available SpringerLink BDIG00002897

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