Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed.

By: Contributor(s): Material type: Computer fileComputer filePublication details: Boston, MA : Springer US, 2008.Edition: 1a edDescription: v.: digitalISBN:
  • 9780387757285
Subject(s): LOC classification:
  • TK7874  T44 2008
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7874 T44 2008 (Browse shelf(Opens below)) Link to resource 1 Available SpringerLink BDIG00002753

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