Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed.
Material type: Computer filePublication details: Boston, MA : Springer US, 2008.Edition: 1a edDescription: v.: digitalISBN:- 9780387757285
- TK7874 T44 2008
Item type | Current library | Call number | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|
Libro Electrónico | Biblioteca Digital Colección Digital | TK7874 T44 2008 (Browse shelf(Opens below)) | Link to resource | 1 | Available | SpringerLink | BDIG00002753 |
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