Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa.
Material type:
Computer fileSeries: Series on Integrated Circuits and SystemsPublisher: Dordrecht : Springer, 2007Description: v.: digitalISBN: 9781402051883Subject(s): Computer science | Software engineering | Computer aided design | Electronics | Systems engineering | Nanotechnology | Computer Science | Circuits and Systems | Electronics and Microelectronics, Instrumentation | Computer-Aided Engineering (CAD, CAE) and Design | Processor Architectures | Software Engineering/Programming and Operating Systems | NanotechnologyLOC classification: TK7867 | C45 2007Online resources: Click here to access online
In:
Springer eBooks
| Item type | Current location | Call number | Vol info | URL | Copy number | Status | Notes | Date due | Barcode |
|---|---|---|---|---|---|---|---|---|---|
Libro Electrónico
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Biblioteca Digital
Responsable: Alejandra Vargas Mejía
Colección Digital
|
TK7867 C45 2007 (Browse shelf) | BDIG00004180 | Link to resource | 1 | Available | SpringerLink | BDIG00004180 |
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