Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa.

By: Chiang, Charles CContributor(s): Kawa, Jamil | SpringerLink (Online service)Material type: Computer fileComputer fileSeries: Series on Integrated Circuits and SystemsPublisher: Dordrecht : Springer, 2007Description: v.: digitalISBN: 9781402051883Subject(s): Computer science | Software engineering | Computer aided design | Electronics | Systems engineering | Nanotechnology | Computer Science | Circuits and Systems | Electronics and Microelectronics, Instrumentation | Computer-Aided Engineering (CAD, CAE) and Design | Processor Architectures | Software Engineering/Programming and Operating Systems | NanotechnologyLOC classification: TK7867 | C45 2007Online resources: Click here to access online In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Current location Call number Vol info URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital
Responsable: Alejandra Vargas Mejía
Colección Digital
TK7867 C45 2007 (Browse shelf) BDIG00004180 Link to resource 1 Available SpringerLink BDIG00004180

There are no comments on this title.

to post a comment.

Powered by Koha