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Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa.

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Computer fileSeries: Series on Integrated Circuits and SystemsPublication details: Dordrecht : Springer, 2007.Description: v.: digitalISBN:

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In: Springer eBooks

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Holdings
Item type	Current library	Call number	Vol info	URL	Copy number	Status	Notes	Date due	Barcode
Libro Electrónico	Biblioteca Digital Colección Digital	TK7867 C45 2007 (Browse shelf(Opens below))	BDIG00004180	Link to resource	1	Available	SpringerLink		BDIG00004180

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