Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] /
by Brent Fultz, James M. Howe.
- Third Edition.
- Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008.
- v.: digital
9783540738862
Chemistry Particles (Nuclear physics) Crystallography Surfaces (Physics) Chemistry Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Crystallography Solid State Physics and Spectroscopy Physics and Applied Physics in Engineering