TY  - DATA
AU  - Fultz,Brent
AU  - Howe,James M.
ED  - SpringerLink (Online service)
TI  - Transmission Electron Microscopy and Diffractometry of Materials
SN  - 9783540738862
PY  - 2008///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Chemistry
KW  - Particles (Nuclear physics)
KW  - Crystallography
KW  - Surfaces (Physics)
KW  - Characterization and Evaluation of Materials
KW  - Surfaces and Interfaces, Thin Films
KW  - Solid State Physics and Spectroscopy
KW  - Physics and Applied Physics in Engineering
UR  - http://dx.doi.org/10.1007/978-3-540-73886-2
ER  -