Sachdev, Manoj.

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition / [electronic resource] : edited by Manoj Sachdev, José Pineda de Gyvez. - Boston, MA : Springer, 2007. - v.: digital - Frontiers in Electronic Testing, 34 0929-1296 ; .

9780387465470


Engineering
Engineering design
Electronics
Systems engineering
Engineering
Circuits and Systems
Electronic and Computer Engineering
Engineering Design
Electronics and Microelectronics, Instrumentation

TK7871.99.M44 / S23 2007