Li, Flora M. <br/><br/>
CCD Image Sensors in Deep-Ultraviolet  Degradation Behavior and Damage Mechanisms /  [electronic resource] : 
by Flora M. Li, Arokia Nathan. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2005. 
 -  v.: digital 
 - Microtechnology and Mems,  1615-8326 .
<br/><br/><label>ISBN: </label>9783540274124 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chemistry<br/>Spectrum analysis<br/>Electronics<br/>Optical materials<br/>Chemistry<br/>Optical and Electronic Materials<br/>Optical Spectroscopy, Ultrafast Optics<br/>Physics and Applied Physics in Engineering<br/>Electronics and Microelectronics, Instrumentation
<br/><br/><label>LC Class. No.: </label>QB121   / S78 2005