TY  - DATA
AU  - Pelliccione,Matthew
AU  - Lu,Toh-Ming
ED  - SpringerLink (Online service)
TI  - Evolution of Thin Film Morphology: Modeling and Simulations 
SN  - 9780387751092
AV  - TK7872.T55  P45 2008
PY  - 2008///
CY  - New York, NY
PB  - Springer-Verlag New York
KW  - Chemistry
KW  - Optical materials
KW  - Chemistry, inorganic
KW  - Surfaces (Physics)
KW  - Surfaces and Interfaces, Thin Films
KW  - Optical and Electronic Materials
KW  - Tribology, Corrosion and Coatings
UR  - http://dx.doi.org/10.1007/978-0-387-75109-2
ER  -