TY  - DATA
AU  - Chiang,Charles C.
AU  - Kawa,Jamil
ED  - SpringerLink (Online service)
TI  - Design for Manufacturability and Yield for Nano-Scale CMOS
SN  - 9781402051883
AV  - TK7867 C45 2007
PY  - 2007///
CY  - Dordrecht
PB  - Springer
KW  - Computer science
KW  - Software engineering
KW  - Computer aided design
KW  - Electronics
KW  - Systems engineering
KW  - Nanotechnology
KW  - Computer Science
KW  - Circuits and Systems
KW  - Electronics and Microelectronics, Instrumentation
KW  - Computer-Aided Engineering (CAD, CAE) and Design
KW  - Processor Architectures
KW  - Software Engineering/Programming and Operating Systems
UR  - http://dx.doi.org/10.1007/978-1-4020-5188-3
ER  -