TY  - DATA
AU  - Okuyama,Masanori
AU  - Ishibashi,Yoshihiro
ED  - SpringerLink (Online service)
TI  - Ferroelectric Thin Films: Basic Properties and Device Physics for Memory Applications 
SN  - 9783540314790
AV  - QC21.2 O38 2005
PY  - 2005///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin/Heidelberg
KW  - Physics
KW  - Crystallography
KW  - Magnetism
KW  - Electronics
KW  - Materials
KW  - Magnetism, Magnetic Materials
KW  - Electronics and Microelectronics, Instrumentation
KW  - Metallic Materials
KW  - Physics and Applied Physics in Engineering
UR  - http://dx.doi.org/10.1007/b99517
ER  -