Yeung, Dit-Yan. <br/><br/>
Structural, Syntactic, and Statistical Pattern Recognition  Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings /  [electronic resource] : 
edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick Ridder. 
 - Berlin, Heidelberg :  Springer-Verlag Berlin Heidelberg,  2006. 
 -  v.: digital 
 - Lecture Notes in Computer Science,  4109  0302-9743  .
<br/><br/><label>ISBN: </label>9783540372417 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer science<br/>Computational complexity<br/>Artificial intelligence<br/>Computer graphics<br/>Computer vision<br/>Optical pattern recognition<br/>Computer Science<br/>Pattern Recognition<br/>Discrete Mathematics in Computer Science<br/>Artificial Intelligence (incl. Robotics)<br/>Computer Graphics<br/>Image Processing and Computer Vision
<br/><br/><label>LC Class. No.: </label>TK7882.P3   / Y48 2006