TY  - DATA
AU  - Yeung,Dit-Yan
AU  - Kwok,James T.
AU  - Fred,Ana
AU  - Roli,Fabio
AU  - Ridder,Dick
ED  - SpringerLink (Online service)
TI  - Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings 
T2  - Lecture Notes in Computer Science,
SN  - 9783540372417
AV  - TK7882.P3  Y48 2006
PY  - 2006///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Computer science
KW  - Computational complexity
KW  - Artificial intelligence
KW  - Computer graphics
KW  - Computer vision
KW  - Optical pattern recognition
KW  - Computer Science
KW  - Pattern Recognition
KW  - Discrete Mathematics in Computer Science
KW  - Artificial Intelligence (incl. Robotics)
KW  - Computer Graphics
KW  - Image Processing and Computer Vision
UR  - http://dx.doi.org/10.1007/11815921
ER  -