Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices [electronic resource] /
edited by Josef Sikula, Michael Levinshtein.
- Dordrecht : Springer Science + Business Media, Inc., 2005.
- v.: digital
- NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry, 151 1568-2609 ; .
9781402021701
Physics Weights and measures Optical materials Physics Optical and Electronic Materials Electronic and Computer Engineering Measurement Science, Instrumentation