01209nmm a22003255u 4500
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DIGITAL
DIGITAL
COLDIG
2012-01-23
1a ed.
TK7867.5 S55 2005
BDIG00003156
2015-01-16 00:00:00
1
http://dx.doi.org/10.1007/1-4020-2170-4
1.00
2015-01-24
LIE
SpringerLink
IT
16330
16330
20200611171616.0
100301s2005 xx j eng d
9781402021701
TK7867.5
S55 2005
Sikula, Josef.
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
[electronic resource] /
edited by Josef Sikula, Michael Levinshtein.
Dordrecht :
Springer Science + Business Media, Inc.,
2005.
v.: digital
NATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry,
1568-2609 ;
151
Physics
Weights and measures
Optical materials
Physics
Optical and Electronic Materials
Electronic and Computer Engineering
Measurement Science, Instrumentation
Levinshtein, Michael.
SpringerLink (Online service)
Springer eBooks
http://dx.doi.org/10.1007/1-4020-2170-4
lcc
LIE