TY  - DATA
AU  - Li,James C.M.
AU  - Yang,Fuqian
ED  - SpringerLink (Online service)
TI  - Micro and Nano Mechanical Testing of Materials and Devices
SN  - 9780387787015
AV  - TK7875 	 L55 2008
PY  - 2008///
CY  - Boston, MA
PB  - Springer-Verlag US
KW  - Chemistry
KW  - Nanotechnology
KW  - Chemistry, inorganic
KW  - Surfaces (Physics)
KW  - Tribology, Corrosion and Coatings
KW  - Characterization and Evaluation of Materials
KW  - Surfaces and Interfaces, Thin Films
UR  - http://dx.doi.org/10.1007/978-0-387-78701-5
ER  -