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1.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev. by Series: Frontiers In Electronic Testing ; 40
Edition: 1a ed.
Material type: Computer file Computer file; Format: electronic
Publication details: Dordrecht : Springer Netherlands, 2008
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7871.99.M44.

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2.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Series: Frontiers in Electronic Testing ; 34
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer, 2007
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7871.99.M44 S23 2007.

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3.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies [electronic resource] / by Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev. by
Edition: 1a ed.
Material type: Computer file Computer file; Format: electronic
Publication details: Dordrecht : Springer Netherlands, 2008
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7871.85 S46 2008.

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4.
Thermal and Power Management of Integrated Circuits [electronic resource] / by Arman Vassighi, Manoj Sachdev. by Series: Series on Integrated Circuits and Systems
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer Science+Business Media, Inc., 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 V37 2006.

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