Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe.
Material type: Computer filePublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008.Edition: Third EditionDescription: v.: digitalISBN:- 9783540738862
No physical items for this record
There are no comments on this title.
Log in to your account to post a comment.