Scanning Probe Microscopy [electronic resource] : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.

By: Contributor(s): Material type: Computer fileComputer filePublication details: New York, NY : Springer Science+Business Media, LLC, 2007.Description: v.: digitalISBN:
  • 9780387286686
Subject(s): LOC classification:
  • QH212.S33 K35 2007
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital QH212.S33 K35 2007 (Browse shelf(Opens below)) Link to resource 1 Available Springerlink BDIG00012300

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