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1.
Gizopoulos / Advances in ElectronicTesting [electronic resource] / edited by Dimitris Gizopoulos. by Series: Frontiers in Electronic Testing ; 27
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer-Verlag US, 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7867 G59 2006 .

2.
Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor. by Series: Frontiers in Electronic Testing ; 37
Edition: 1a ed
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer-Verlag US, 2008
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: T174.7 T44 2008.

3.
Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. by Series: Frontiers in Electronic Testing ; 31
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 .H85 2005.

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New Methods of Concurrent Checking [electronic resource] / by Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld. by Series: Frontiers In Electronic Testing ; 42
Material type: Computer file Computer file; Format: electronic
Publication details: Dordrecht : Springer Science+Business Media B.V., 2008
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 G64 2008.

6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Series: Frontiers in Electronic Testing ; 34
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer, 2007
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7871.99.M44 S23 2007.

7.
Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen. by Series: Frontiers in Electronic Testing ; 33
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer, 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7878 M33 2006.

8.
The Core Test Wrapper Handbook [electronic resource] : Rationale and Application of IEEE Std. 1500™ / by Francisco Silva, Teresa McLaurin, Tom Waayers. by Series: Frontiers in Electronic Testing ; 35
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer Science+Business Media, LLC, 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7895.E42 S55 2006.

9.
Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha. by Series: Frontiers in Electronic Testing ; 30
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer, 2005
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874.654 .K335 2005.

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