Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.
Material type: Computer fileSeries: Frontiers in Electronic Testing ; 34Publication details: Boston, MA : Springer, 2007.Description: v.: digitalISBN:- 9780387465470
- TK7871.99.M44 S23 2007
Item type | Current library | Call number | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | |
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Libro Electrónico | Biblioteca Digital Colección Digital | TK7871.99.M44 S23 2007 (Browse shelf(Opens below)) | BDIG00001879 | Link to resource | 1 | Available | SpringerLink | BDIG00001879 |
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