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1.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Series: Frontiers in Electronic Testing ; 34
Material type: Computer file Computer file; Format: electronic
Publication details: Boston, MA : Springer, 2007
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7871.99.M44 S23 2007.

2.
Thermal and Power Management of Integrated Circuits [electronic resource] / by Arman Vassighi, Manoj Sachdev. by Series: Series on Integrated Circuits and Systems
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer Science+Business Media, Inc., 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 V37 2006.

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