Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Frontiers in Electronic Testing ; 34Publication details: Boston, MA : Springer, 2007.Description: v.: digitalISBN:
  • 9780387465470
Subject(s): LOC classification:
  • TK7871.99.M44 S23 2007
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number Vol info URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7871.99.M44 S23 2007 (Browse shelf(Opens below)) BDIG00001879 Link to resource 1 Available SpringerLink BDIG00001879

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