Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.
Material type: Computer fileSeries: Frontiers in Electronic Testing ; 37Publication details: Boston, MA : Springer-Verlag US, 2008.Edition: 1a edDescription: v.: digitalISBN:- 9780387747477
- T174.7 T44 2008
Item type | Current library | Call number | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|---|
Libro Electrónico | Biblioteca Digital Colección Digital | T174.7 T44 2008 (Browse shelf(Opens below)) | BDIG00002649 | Link to resource | 1 | Available | SpringerLink | BDIG00002649 |
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