Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Frontiers in Electronic Testing ; 37Publication details: Boston, MA : Springer-Verlag US, 2008.Edition: 1a edDescription: v.: digitalISBN:
  • 9780387747477
Subject(s): LOC classification:
  • T174.7  T44 2008
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number Vol info URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital T174.7 T44 2008 (Browse shelf(Opens below)) BDIG00002649 Link to resource 1 Available SpringerLink BDIG00002649

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