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1.
Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. by Series: Frontiers in Electronic Testing ; 31
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874 .H85 2005.

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2.
Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen. by Series: Frontiers in Electronic Testing ; 33
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer, 2006
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7878 M33 2006.

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3.
Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha. by Series: Frontiers in Electronic Testing ; 30
Material type: Computer file Computer file; Format: electronic available online remote
Publication details: Boston, MA : Springer, 2005
In: Springer eBooks
Online resources:
Availability: Items available for loan: Biblioteca Digital (1)Call number: TK7874.654 .K335 2005.

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