CCD Image Sensors in Deep-Ultraviolet [electronic resource] : Degradation Behavior and Damage Mechanisms / by Flora M. Li, Arokia Nathan.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Microtechnology and MemsPublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.Description: v.: digitalISBN:
  • 9783540274124
Subject(s): LOC classification:
  • QB121  S78 2005
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Date due Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital QB121 S78 2005 (Browse shelf(Opens below)) Link to resource 1 Available Springer link BDIG00009064

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