Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer.
Material type: Computer filePublication details: Boston, MA : Springer Science+Business Media, Inc., 2007.Description: v.: digitalISBN:- 9780387292618
- Chemistry
- Condensed matter
- Particles (Nuclear physics)
- Electronics
- Nanotechnology
- Surfaces (Physics)
- Chemistry
- Characterization and Evaluation of Materials
- Surfaces and Interfaces, Thin Films
- Nanotechnology
- Solid State Physics and Spectroscopy
- Condensed Matter
- Electronics and Microelectronics, Instrumentation
- QC176.83 A44 2007
Item type | Current library | Call number | URL | Copy number | Status | Notes | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|---|
Libro Electrónico | Biblioteca Digital Colección Digital | QC176.83 A44 2007 (Browse shelf(Opens below)) | Link to resource | 1 | Available | Springerlink | BDIG00010030 |
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