Scanning Probe Microscopy [electronic resource] : Electrical and Electromechanical Phenomena at the Nanoscale / edited by Sergei Kalinin, Alexei Gruverman.

By: Contributor(s): Material type: Computer fileComputer filePublication details: New York, NY : Springer Science+Business Media, LLC, 2007.Description: v.: digitalISBN:
  • 9780387286686
Subject(s): LOC classification:
  • QH212.S33 K35 2007
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital QH212.S33 K35 2007 (Browse shelf(Opens below)) Link to resource 1 Available Springerlink BDIG00012300

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