Software reliability : measurement, prediction, application / John D. Musa, Anthony Iannino, Kazuhira Okumoto.

By: Contributor(s): Material type: TextTextSeries: Software engineering and technologyPublication details: New York, NY. : McGraw-Hill, c1987Edition: 1a edDescription: xvii, 621 p. : il. ; 23 cmISBN:
  • 007044093X
Subject(s): LOC classification:
  • QA76.76.T48  M87 1987
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Item type Current library Call number Copy number Status Barcode
Libro Libro Biblioteca de la Facultad de Ingeniería Eléctrica General QA76.76.T48 M87 1987 (Browse shelf(Opens below)) C:1 Available BIE000001451

Incluye apéndice e índice

Bibliografía : p. 593-599

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