CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Frontiers In Electronic Testing ; 40Publication details: Dordrecht : Springer Netherlands, 2008.Edition: 1a edDescription: v.: digitalISBN:
  • 9781402083631
Subject(s): LOC classification:
  • TK7871.99.M44  P38 2008
Online resources: In: Springer eBooks
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Item type Current library Call number URL Copy number Status Notes Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7871.99.M44 (Browse shelf(Opens below)) Link to resource 1 Available SpringerLink BDIG00005007

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