CCD Image Sensors in Deep-Ultraviolet [electronic resource] : Degradation Behavior and Damage Mechanisms / by Flora M. Li, Arokia Nathan.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Microtechnology and MemsPublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005.Description: v.: digitalISBN:
  • 9783540274124
Subject(s): LOC classification:
  • QB121  S78 2005
Online resources: In: Springer eBooks
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Item type Current library Call number URL Copy number Status Notes Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital QB121 S78 2005 (Browse shelf(Opens below)) Link to resource 1 Available Springer link BDIG00009064

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