Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein ... [et al].

Contributor(s): Material type: TextTextPublication details: New York : Springer ; c2007Edition: 3a. edDescription: xix, 690 p. : il. ; 25 cm. + 1 cd-rom (4 3/4 plg.)ISBN:
  • 9780306472923
Subject(s): LOC classification:
  • QC481  S23 2007
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Item type Current library Call number Copy number Status Notes Barcode
Libro Libro Biblioteca de la Facultad de Físico Matemáticas General QC481 S23 2007 C:1 (Browse shelf(Opens below)) C:1 Available Lectura FFM000002759

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