Brandon, David. <br/><br/>
Microstructural characterization of materials 
/ David Brandon, Wayne D. Kaplan. 
 - 2a ed. 
 - England :  John Wiley & Sons,  2008. 
 - xiv, 536 p. :  il. ;  25 cm. 
 - Quantitative software engineering series .
<br/><br/>Incluye apéndice, bibliografía e índice 
<br/><br/><label>ISBN: </label>9780470027851 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materiales--Microcopía<br/>Microestructura
<br/><br/><label>LC Class. No.: </label>TA417.23  / B73 2008