TY  - DATA
AU  - Sikula,Josef
AU  - Levinshtein,Michael
ED  - SpringerLink (Online service)
TI  - Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
SN  - 9781402021701
AV  - TK7867.5 S55 2005
PY  - 2005///
CY  - Dordrecht
PB  - Springer Science + Business Media, Inc.
KW  - Physics
KW  - Weights and measures
KW  - Optical materials
KW  - Optical and Electronic Materials
KW  - Electronic and Computer Engineering
KW  - Measurement Science, Instrumentation
UR  - http://dx.doi.org/10.1007/1-4020-2170-4
ER  -