Sachdev, Manoj. <br/><br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits  2nd Edition /  [electronic resource] : 
edited by Manoj Sachdev, José Pineda de Gyvez. 
 - Boston, MA :  Springer,  2007. 
 -  v.: digital 
 - Frontiers in Electronic Testing,  34  0929-1296 ; .
<br/><br/><label>ISBN: </label>9780387465470 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Engineering<br/>Engineering design<br/>Electronics<br/>Systems engineering<br/>Engineering<br/>Circuits and Systems<br/>Electronic and Computer Engineering<br/>Engineering Design<br/>Electronics and Microelectronics, Instrumentation
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44  / S23 2007