TY  - DATA
AU  - Sachdev,Manoj
AU  - Gyvez,José Pineda de
ED  - SpringerLink (Online service)
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits: 2nd Edition 
SN  - 9780387465470
AV  - TK7871.99.M44 S23 2007
PY  - 2007///
CY  - Boston, MA
PB  - Springer
KW  - Engineering
KW  - Engineering design
KW  - Electronics
KW  - Systems engineering
KW  - Circuits and Systems
KW  - Electronic and Computer Engineering
KW  - Engineering Design
KW  - Electronics and Microelectronics, Instrumentation
UR  - http://dx.doi.org/10.1007/0-387-46547-2
ER  -