TY  - DATA
AU  - Cullis,A.G.
AU  - Hutchison,J.L.
ED  - SpringerLink (Online service)
TI  - Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK 
SN  - 9783540319153
AV  - QC611.6.M5 C85 2005
PY  - 2005///
CY  - Berlin, Heidelberg
PB  - Springer-Verlag Berlin Heidelberg
KW  - Chemistry
KW  - Weights and measures
KW  - Particles (Nuclear physics)
KW  - Electronics
KW  - Materials Science
KW  - Solid State Physics and Spectroscopy
KW  - Measurement Science, Instrumentation
KW  - Electronics and Microelectronics, Instrumentation
UR  - http://dx.doi.org/10.1007/3-540-31915-8
ER  -