Microscopy of Semiconducting Materials 2007 - Cullis, A. G.; Midgley, P. A.; SpringerLink (Online service) (Dordrecht : Springer Netherlands, 2008)
Keywords: Materials; Weights and measures; Particles (Nuclear physics); Electronics; Material Science; Materials Science, general; Solid State Physics and Spectroscopy; Measurement Science, Instrumentation; Electronics and Microelectronics, Instrumentation