TY  - DATA
AU  - Cullis,A.G.
AU  - Midgley,P.A.
ED  - SpringerLink (Online service)
TI  - Microscopy of Semiconducting Materials 2007
T2  - Springer Proceedings in Physics,
SN  - 9781402086151
AV  - QC611.6.S9 C85 2008
PY  - 2008///
CY  - Dordrecht
PB  - Springer Netherlands
KW  - Materials
KW  - Weights and measures
KW  - Particles (Nuclear physics)
KW  - Electronics
KW  - Material Science
KW  - Materials Science, general
KW  - Solid State Physics and Spectroscopy
KW  - Measurement Science, Instrumentation
KW  - Electronics and Microelectronics, Instrumentation
UR  - http://dx.doi.org/10.1007/978-1-4020-8615-1
ER  -