TY  - DATA
AU  - Gusev,Evgeni
ED  - SpringerLink (Online service)
TI  - Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices 
SN  - 9781402043673
AV  - TK7895.G36 G36 2006
PY  - 2006///
CY  - Dordrecht
PB  - Springer
KW  - Engineering
KW  - Condensed matter
KW  - Electronics
KW  - Electronic and Computer Engineering
KW  - Condensed Matter
KW  - Physics and Applied Physics in Engineering
KW  - Electronics and Microelectronics, Instrumentation
UR  - http://dx.doi.org/10.1007/1-4020-4367-8
ER  -