Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed.

By: Contributor(s): Material type: Computer fileComputer filePublication details: Boston, MA : Springer US, 2008.Edition: 1a edDescription: v.: digitalISBN:
  • 9780387757285
Subject(s): LOC classification:
  • TK7874  T44 2008
Online resources: In: Springer eBooks
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Holdings
Item type Current library Call number URL Copy number Status Notes Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7874 T44 2008 (Browse shelf(Opens below)) Link to resource 1 Available SpringerLink BDIG00002753

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