Synthetic Polymeric Membranes [electronic resource] : Characterization by Atomic Force Microscopy / by K. C. Khulbe, C. Y. Feng, Takeshi Matsuura.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Springer LaboratoryPublication details: Berlin, Heidelberg : Springer-Verlag, 2008.Description: v.: digitalISBN:
  • 9783540739944
Subject(s): LOC classification:
  • TP159.M4  K48 2008
Online resources: In: Springer eBooks
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Item type Current library Call number URL Copy number Status Notes Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TP159.M4 K48 2008 (Browse shelf(Opens below)) Link to resource 1 Available Springerlink BDIG00012752

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