Transmission Electron Microscopy and Diffractometry of Materials [electronic resource] / by Brent Fultz, James M. Howe.

By: Contributor(s): Material type: Computer fileComputer filePublication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2008.Edition: Third EditionDescription: v.: digitalISBN:
  • 9783540738862
Subject(s): Online resources: In: Springer eBooks
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