Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson.

By: Contributor(s): Material type: Computer fileComputer fileSeries: Frontiers in Electronic Testing ; 29Publication details: Boston, MA : Springer, 2005.Edition: 1a edDescription: v.: digitalISBN:
  • 9780387256245
Subject(s): LOC classification:
  • TK7895.E42 L37 2005
Online resources: In: Springer eBooks
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Item type Current library Call number URL Copy number Status Notes Barcode
Libro Electrónico Libro Electrónico Biblioteca Digital Colección Digital TK7895.E42 2005 (Browse shelf(Opens below)) Link to resource 1 Available SpringerLink BDIG00003361

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