Quantitative X-ray diffractometry / Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik

By: Contributor(s): Material type: TextTextPublication details: New York : Springer, 1987Edition: 1a edDescription: xvii, 372 p. : il. ; 24 cmISBN:
  • 0387945415
Subject(s): LOC classification:
  • QC482.D5 Z48 1995
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Holdings
Item type Current library Call number Copy number Status Barcode
Libro Libro Biblioteca del Instituto de Investigación en Metalurgia y Materiales General QC482.D5 Z48 1995 (Browse shelf(Opens below)) 1 Available BIIM000000303

Bibliografía : p. 355-364 e índice

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