Microstructural characterization of materials / David Brandon, Wayne D. Kaplan.

By: Contributor(s): Material type: TextTextSeries: Quantitative software engineering seriesPublication details: England : John Wiley & Sons, 2008.Edition: 2a edDescription: xiv, 536 p. : il. ; 25 cmISBN:
  • 9780470027851
Subject(s): LOC classification:
  • TA417.23 B73 2008
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Holdings
Item type Current library Call number Copy number Status Barcode
Libro Libro Biblioteca del Instituto de Investigación en Metalurgia y Materiales General TA417.23 B73 2008 (Browse shelf(Opens below)) 1 Available BIIM000001544

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